Metrology in Modern Measurement Systems and Sensors: Design, Application, Research and Challenges
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Physical Sensors".
Deadline for manuscript submissions: 31 March 2026 | Viewed by 311
Special Issue Editors
Interests: advanced metering infrastructure; diagnostics; metrology; power quality; signal processing
Special Issues, Collections and Topics in MDPI journals
Interests: advanced metering infrastructure; detection of power quality disturbances; identification of disturbing loads; metrology; power quality diagnostics; power quality evaluation; power quality monitoring
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Modern technological solutions, including those based on machine learning algorithms, require reliable, optimal and solid measurement results from sensors or entire measurement systems to function correctly, describing the variables used to make decisions or for control. This situation poses significant challenges in the metrology of modern measurement systems and sensors. Obtaining reliable data that enable the precise operation of modern technological solutions requires the development of new measurement systems and specific sensors. Almost always, achieving such a goal is preceded by long-term complementary research, the results of which allow for breakthrough achievements and open up further research areas.
This Special Issue will present the most important problems in metrology in modern measurement systems and sensors, in particular in the areas of design, application and research. It is also likely that the issues presented in this way will open up challenges related to modern measurement systems and sensors. This Special Issue will focus on the following topics:
- Measurements of physical and chemical quantities;
- Measurements in biology and medicine;
- Measurements and diagnostic systems;
- Processing of measurement signals;
- Analysis of measurement results and assessment of uncertainty;
- Modeling of measurement systems.
Dr. Piotr Kuwalek
Prof. Dr. Grzegorz Wiczyński
Prof. Dr. Mariusz Rząsa
Guest Editors
Manuscript Submission Information
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Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- measurements
- measurement diagnostics
- measurement infrastructure
- metrology
- signal analysis
- signal processing
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